中国物理B ›› 2016, Vol. 25 ›› Issue (4): 48101-048101.doi: 10.1088/1674-1056/25/4/048101

• INTERDISCIPLINARY PHYSICS AND RELATED AREAS OF SCIENCE AND TECHNOLOGY • 上一篇    下一篇

Field emission properties of a-C and a-C:H films deposited on silicon surfaces modified with nickel nanoparticles

Jin-Long Jiang(姜金龙), Yu-Bao Wang(王玉宝), Qiong Wang(王琼), Hao Huang(黄浩), Zhi-Qiang Wei(魏智强), Jun-Ying Hao(郝俊英)   

  1. 1 Department of Physics, Lanzhou University of Technology, Lanzhou 730050, China;
    2 State Key Laboratory of Solid Lubrication, Lanzhou Institute of Chemical Physics, Chinese Academy of Sciences, Lanzhou 730000, China
  • 收稿日期:2015-10-13 修回日期:2015-12-01 出版日期:2016-04-05 发布日期:2016-04-05
  • 通讯作者: Jin-Long Jiang E-mail:golden_dragon@126.com
  • 基金资助:
    Project supported by the National Natural Science Foundation of China (Grant No. 51105186).

Field emission properties of a-C and a-C:H films deposited on silicon surfaces modified with nickel nanoparticles

Jin-Long Jiang(姜金龙)1, Yu-Bao Wang(王玉宝)1, Qiong Wang(王琼)1, Hao Huang(黄浩)1, Zhi-Qiang Wei(魏智强)1, Jun-Ying Hao(郝俊英)2   

  1. 1 Department of Physics, Lanzhou University of Technology, Lanzhou 730050, China;
    2 State Key Laboratory of Solid Lubrication, Lanzhou Institute of Chemical Physics, Chinese Academy of Sciences, Lanzhou 730000, China
  • Received:2015-10-13 Revised:2015-12-01 Online:2016-04-05 Published:2016-04-05
  • Contact: Jin-Long Jiang E-mail:golden_dragon@126.com
  • Supported by:
    Project supported by the National Natural Science Foundation of China (Grant No. 51105186).

摘要: The a-C and a-C:H films are deposited on silicon surfaces modified with and without nickel nanoparticles by using mid-frequency magnetron sputtering. The microstructures and morphologies of the films are analyzed by Raman spectroscopy and atomic force microscopy. Field emission behaviors of the deposited films with and without nickel nanoparticles modification are comparatively investigated. It is found that the hydrogen-free carbon film exhibits a high field emission current density and low turn-on electric field compared with the hydrogenated carbon film. Nickel modifying could increase the current density, whereas it has no significant effect on the turn-on electric field. The mechanism of field electron emission of a sample is discussed from the surface morphologies of the films and nickel nanoparticle roles in the interface between film and substrate.

关键词: DLC films, field emission, magnetron sputtering, nickel nanoparticles modification

Abstract: The a-C and a-C:H films are deposited on silicon surfaces modified with and without nickel nanoparticles by using mid-frequency magnetron sputtering. The microstructures and morphologies of the films are analyzed by Raman spectroscopy and atomic force microscopy. Field emission behaviors of the deposited films with and without nickel nanoparticles modification are comparatively investigated. It is found that the hydrogen-free carbon film exhibits a high field emission current density and low turn-on electric field compared with the hydrogenated carbon film. Nickel modifying could increase the current density, whereas it has no significant effect on the turn-on electric field. The mechanism of field electron emission of a sample is discussed from the surface morphologies of the films and nickel nanoparticle roles in the interface between film and substrate.

Key words: DLC films, field emission, magnetron sputtering, nickel nanoparticles modification

中图分类号:  (Carbon/carbon-based materials)

  • 81.05.U-
79.70.+q (Field emission, ionization, evaporation, and desorption) 81.15.Cd (Deposition by sputtering)