中国物理B ›› 2016, Vol. 25 ›› Issue (4): 47801-047801.doi: 10.1088/1674-1056/25/4/047801

• CONDENSED MATTER: ELECTRONIC STRUCTURE, ELECTRICAL, MAGNETIC, AND OPTICAL PROPERTIES • 上一篇    下一篇

Apparent directional spectral emissivity determination of semitransparent materials

Chun-Yang Niu(牛春洋), Hong Qi(齐宏), Ya-Tao Ren(任亚涛), Li-Ming Ruan(阮立明)   

  1. School of Energy Science and Engineering, Harbin Institute of Technology, Harbin 150001, China
  • 收稿日期:2015-11-13 修回日期:2015-12-14 出版日期:2016-04-05 发布日期:2016-04-05
  • 通讯作者: Hong Qi E-mail:qihong@hit.edu.cn
  • 基金资助:
    Project supported by the National Natural Science Foundation of China (Grant Nos. 51476043 and 51576053) and the Foundation for Innovative Research Groups of the National Natural Science Foundation of China (Grant No. 51421063).

Apparent directional spectral emissivity determination of semitransparent materials

Chun-Yang Niu(牛春洋), Hong Qi(齐宏), Ya-Tao Ren(任亚涛), Li-Ming Ruan(阮立明)   

  1. School of Energy Science and Engineering, Harbin Institute of Technology, Harbin 150001, China
  • Received:2015-11-13 Revised:2015-12-14 Online:2016-04-05 Published:2016-04-05
  • Contact: Hong Qi E-mail:qihong@hit.edu.cn
  • Supported by:
    Project supported by the National Natural Science Foundation of China (Grant Nos. 51476043 and 51576053) and the Foundation for Innovative Research Groups of the National Natural Science Foundation of China (Grant No. 51421063).

摘要: An inverse estimation method and corresponding measurement system are developed to measure the apparent spectral directional emissivities of semitransparent materials. The normal spectral emissivity and transmissivity serve as input for the inverse analysis. Consequently, the refractive index and absorption coefficient of the semitransparent material could be retrieved by using the pseudo source adding method as the forward method and the stochastic particle swarm optimization algorithm as the inverse method. Finally, the arbitrary apparent spectral directional emissivity of semitransparent material is estimated by using the pseudo source adding method given the retrieval refractive index and absorption coefficient. The present system has the advantage of a simple experimental structure, high accuracy, and excellent capability to measure the emissivity in an arbitrary direction. Furthermore, the apparent spectral directional emissivity of sapphire at 773 K is measured by using this system in a spectral range of 3 μm-12 μm and a viewing range of 0°-90°. The present method paves the way for a new directional spectral emissivity measurement strategy.

关键词: semitransparent materials, inverse problem, directional emissivity

Abstract: An inverse estimation method and corresponding measurement system are developed to measure the apparent spectral directional emissivities of semitransparent materials. The normal spectral emissivity and transmissivity serve as input for the inverse analysis. Consequently, the refractive index and absorption coefficient of the semitransparent material could be retrieved by using the pseudo source adding method as the forward method and the stochastic particle swarm optimization algorithm as the inverse method. Finally, the arbitrary apparent spectral directional emissivity of semitransparent material is estimated by using the pseudo source adding method given the retrieval refractive index and absorption coefficient. The present system has the advantage of a simple experimental structure, high accuracy, and excellent capability to measure the emissivity in an arbitrary direction. Furthermore, the apparent spectral directional emissivity of sapphire at 773 K is measured by using this system in a spectral range of 3 μm-12 μm and a viewing range of 0°-90°. The present method paves the way for a new directional spectral emissivity measurement strategy.

Key words: semitransparent materials, inverse problem, directional emissivity

中图分类号:  (Optical constants (including refractive index, complex dielectric constant, absorption, reflection and transmission coefficients, emissivity))

  • 78.20.Ci
02.30.Zz (Inverse problems) 44.40.+a (Thermal radiation) 45.10.Db (Variational and optimization methods)