›› 2014, Vol. 23 ›› Issue (11): 113201-113201.doi: 10.1088/1674-1056/23/11/113201

• ATOMIC AND MOLECULAR PHYSICS • 上一篇    下一篇

Broadband time-resolved elliptical crystal spectrometer for X-ray spectroscopic measurements in laser-produced plasmas

王瑞荣, 贾果, 方智恒, 王伟, 孟祥富, 谢志勇, 张帆   

  1. Shanghai Institute of Laser Plasma, Shanghai 201800, China
  • 收稿日期:2014-01-15 修回日期:2014-04-16 出版日期:2014-11-15 发布日期:2014-11-15
  • 基金资助:
    Project supported by the National Natural Science Foundation of China (Grant No. 11175167).

Broadband time-resolved elliptical crystal spectrometer for X-ray spectroscopic measurements in laser-produced plasmas

Wang Rui-Rong (王瑞荣), Jia Guo (贾果), Fang Zhi-Heng (方智恒), Wang Wei (王伟), Meng Xiang-Fu (孟祥富), Xie Zhi-Yong (谢志勇), Zhang Fan (张帆)   

  1. Shanghai Institute of Laser Plasma, Shanghai 201800, China
  • Received:2014-01-15 Revised:2014-04-16 Online:2014-11-15 Published:2014-11-15
  • Contact: Wang Rui-Rong E-mail:wangrr59@sina.com
  • Supported by:
    Project supported by the National Natural Science Foundation of China (Grant No. 11175167).

摘要: The X-ray spectrometer used in high-energy-density plasma experiments generally requires both broad X-ray energy coverage and high temporal, spatial, and spectral resolutions for overcoming the difficulties imposed by the X-ray background, debris, and mechanical shocks. By using an elliptical crystal together with a streak camera, we resolve this issue at the SG-II laser facility. The carefully designed elliptical crystal has a broad spectral coverage with high resolution, strong rejection of the diffuse and/or fluorescent background radiation, and negligible source broadening for extended sources. The spectra that are Bragg reflected (23°<θ<38°) from the crystal are focused onto a streak camera slit 18 mm long and about 80 μm wide, to obtain a time-resolved spectrum. With experimental measurements, we demonstrate that the quartz(1011) elliptical analyzer at the SG-II laser facility has a single-shot spectral range of (4.64-6.45) keV, a typical spectral resolution of EE=560, and an enhanced focusing power in the spectral dimension. For titanium (Ti) data, the lines of interest show a distribution as a function of time and the temporal variations of the He-α and Li-like Ti satellite lines and their spatial profiles show intensity peak red shifts. The spectrometer sensitivity is illustrated with a temporal resolution of better than 25 ps, which satisfies the near-term requirements of high-energy-density physics experiments.

关键词: X-ray spectrum, red shift, time-dependent phenomena

Abstract: The X-ray spectrometer used in high-energy-density plasma experiments generally requires both broad X-ray energy coverage and high temporal, spatial, and spectral resolutions for overcoming the difficulties imposed by the X-ray background, debris, and mechanical shocks. By using an elliptical crystal together with a streak camera, we resolve this issue at the SG-II laser facility. The carefully designed elliptical crystal has a broad spectral coverage with high resolution, strong rejection of the diffuse and/or fluorescent background radiation, and negligible source broadening for extended sources. The spectra that are Bragg reflected (23°<θ<38°) from the crystal are focused onto a streak camera slit 18 mm long and about 80 μm wide, to obtain a time-resolved spectrum. With experimental measurements, we demonstrate that the quartz(1011) elliptical analyzer at the SG-II laser facility has a single-shot spectral range of (4.64-6.45) keV, a typical spectral resolution of EE=560, and an enhanced focusing power in the spectral dimension. For titanium (Ti) data, the lines of interest show a distribution as a function of time and the temporal variations of the He-α and Li-like Ti satellite lines and their spatial profiles show intensity peak red shifts. The spectrometer sensitivity is illustrated with a temporal resolution of better than 25 ps, which satisfies the near-term requirements of high-energy-density physics experiments.

Key words: X-ray spectrum, red shift, time-dependent phenomena

中图分类号:  (X-ray spectra)

  • 32.30.Rj
32.70.Jz (Line shapes, widths, and shifts) 31.70.Hq (Time-dependent phenomena: excitation and relaxation processes, and reaction rates)