中国物理B ›› 2011, Vol. 20 ›› Issue (8): 87503-087503.doi: 10.1088/1674-1056/20/8/087503

• CONDENSED MATTER: ELECTRONIC STRUCTURE, ELECTRICAL, MAGNETIC, AND OPTICAL PROPERTIES • 上一篇    下一篇

Determining the sign of g factor via time-resolved Kerr rotation spectroscopy with a rotatable magnetic field

谷晓芳, 钱轩, 姬扬, 陈林, 赵建华   

  1. State Key Laboratory for Superlattices and Microstructures, Institute of Semiconductors, Chinese Academy of Sciences, Beijing 100083, China
  • 收稿日期:2010-12-22 修回日期:2011-04-17 出版日期:2011-08-15 发布日期:2011-08-15
  • 基金资助:
    Project supported by the National Basic Research Program of China (Grant No. 2009CB929301) and the National Natural Science Foundation of China (Grant No. 10911130232).

Determining the sign of g factor via time-resolved Kerr rotation spectroscopy with a rotatable magnetic field

Gu Xiao-Fang(谷晓芳), Qian Xuan(钱轩), Ji Yang(姬扬), Chen Lin(陈林), and Zhao Jian-Hua(赵建华)   

  1. State Key Laboratory for Superlattices and Microstructures, Institute of Semiconductors, Chinese Academy of Sciences, Beijing 100083, China
  • Received:2010-12-22 Revised:2011-04-17 Online:2011-08-15 Published:2011-08-15
  • Supported by:
    Project supported by the National Basic Research Program of China (Grant No. 2009CB929301) and the National Natural Science Foundation of China (Grant No. 10911130232).

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摘要： Time-resolved Kerr rotation spectroscopy is used to determine the sign of the g factor of carriers in a semiconductor material, with the help of a rotatable magnetic field in the plane of the sample. The spin precession signal of carriers at a fixed time delay is measured as a function of the orientation of the magnetic field with a fixed strength B. The signal has a sine-like form and its phase determines the sign of the g factor of carriers. As a natural extension of previous methods to measure the (time-resolved) photoluminescence or time-resolved Kerr rotation signal as a function of the magnetic field strength with a fixed orientation, such a method gives the correct sign of the g factor of electrons in GaAs. Furthermore, the sign of carriers in a (Ga, Mn)As magnetic semiconductor is also found to be negative.

Abstract: Time-resolved Kerr rotation spectroscopy is used to determine the sign of the g factor of carriers in a semiconductor material, with the help of a rotatable magnetic field in the plane of the sample. The spin precession signal of carriers at a fixed time delay is measured as a function of the orientation of the magnetic field with a fixed strength B. The signal has a sine-like form and its phase determines the sign of the g factor of carriers. As a natural extension of previous methods to measure the (time-resolved) photoluminescence or time-resolved Kerr rotation signal as a function of the magnetic field strength with a fixed orientation, such a method gives the correct sign of the g factor of electrons in GaAs. Furthermore, the sign of carriers in a (Ga, Mn)As magnetic semiconductor is also found to be negative.

Key words: g factor, time-resolved Kerr rotation, gallium arsenide, rotatable magnetic field

中图分类号:  (Dynamic properties?)

  • 75.40.Gb
76.50.+g (Ferromagnetic, antiferromagnetic, and ferrimagnetic resonances; spin-wave resonance) 75.90.+w (Other topics in magnetic properties and materials) 78.67.-n (Optical properties of low-dimensional, mesoscopic, and nanoscale materials and structures)