Shock wave velocity measurement in the Al2O3 under ultrahigh pressure

doi:10.1088/1674-1056/20/6/065202

中国物理B ›› 2011, Vol. 20 ›› Issue (6): 65202-065202.doi: 10.1088/1674-1056/20/6/065202

Shock wave velocity measurement in the Al₂O₃ under ultrahigh pressure

李永升¹, 王峰², 彭晓世², 刘慎业², 蒋小华², 丁永坤²

(1)Institute of Applied Physics and Computational Mathematics, Beijing 100088, China; (2)Research Centre of Laser Fusion, Chinese Academy of Engineering Physics, Mianyang 621900, China

收稿日期:2010-09-10 修回日期:2011-02-24 出版日期:2011-06-15 发布日期:2011-06-15
基金资助:
Project supported by the National Natural Science Foundation of China (Grant No. 10805041) and the Science and Technology Foundation on Plasma Physics Laboratory (Grant No. 9140C6801021001).

Shock wave velocity measurement in the Al₂O₃ under ultrahigh pressure

Wang Feng (王峰)^a, Peng Xiao-Shi (彭晓世)^a, Liu Shen-Ye (刘慎业)^a, Li Yong-Sheng (李永升)^b, Jiang Xiao-Hua (蒋小华)^a, Ding Yong-Kun (丁永坤)^a

^a Research Centre of Laser Fusion, Chinese Academy of Engineering Physics, Mianyang 621900, China; ^b Institute of Applied Physics and Computational Mathematics, Beijing 100088, China

Received:2010-09-10 Revised:2011-02-24 Online:2011-06-15 Published:2011-06-15
Supported by:
Project supported by the National Natural Science Foundation of China (Grant No. 10805041) and the Science and Technology Foundation on Plasma Physics Laboratory (Grant No. 9140C6801021001).

摘要/Abstract

摘要： In indirect-drive experiment, the blank effect caused by X-rays from Hohlraum will show the dark area in time scale of optical streak camera (OSC). This blank effect, which was a serious problem in indirect-drive shock wave experiments, has been explained by the semiconductor model. The X-rays cause the band to band transition and the probe laser is absorbed by the intraband transition, which leads to a dark region in time scale of the OSC image. In the experiment, the reflectivity of shock wave front was measured to be about 50% at shock wave velocity 32 km/s and was compared to the theoretical calculations with the Drude free electron model. From the experimental data, it is found that the blank effect can be avoided at radiation temperature of 170 eV if the Al layer is thicker than 60 μm.

关键词: shock wave, optical diagnosis, interfere meter, semiconductor model

Abstract: In indirect-drive experiment, the blank effect caused by X-rays from Hohlraum will show the dark area in time scale of optical streak camera (OSC). This blank effect, which was a serious problem in indirect-drive shock wave experiments, has been explained by the semiconductor model. The X-rays cause the band to band transition and the probe laser is absorbed by the intraband transition, which leads to a dark region in time scale of the OSC image. In the experiment, the reflectivity of shock wave front was measured to be about 50% at shock wave velocity 32 km/s and was compared to the theoretical calculations with the Drude free electron model. From the experimental data, it is found that the blank effect can be avoided at radiation temperature of 170 eV if the Al layer is thicker than 60 μm.

Key words: shock wave, optical diagnosis, interfere meter, semiconductor model

中图分类号: (Shock waves and discontinuities)

52.35.Tc

52.50.Lp (Plasma production and heating by shock waves and compression)

王峰, 彭晓世, 刘慎业, 李永升, 蒋小华, 丁永坤. Shock wave velocity measurement in the Al₂O₃ under ultrahigh pressure[J]. 中国物理B, 2011, 20(6): 65202-065202.

Wang Feng (王峰), Peng Xiao-Shi (彭晓世), Liu Shen-Ye (刘慎业), Li Yong-Sheng (李永升), Jiang Xiao-Hua (蒋小华), Ding Yong-Kun (丁永坤). Shock wave velocity measurement in the Al₂O₃ under ultrahigh pressure[J]. Chin. Phys. B, 2011, 20(6): 65202-065202.

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Shock wave velocity measurement in the Al₂O₃ under ultrahigh pressure

Shock wave velocity measurement in the Al₂O₃ under ultrahigh pressure

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