中国物理B ›› 2011, Vol. 20 ›› Issue (2): 26103-026103.doi: 10.1088/1674-1056/20/2/026103

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Effects of the sputtering power on the crystalline structure and optical properties of the silver oxide films deposited using direct-current reactive magnetron sputtering

郜小勇, 张增院, 马姣民, 卢景霄, 谷锦华, 杨仕娥   

  1. The Key Lab of Materials Physics of Ministry of Education, School of Physics and Engineering, Zhengzhou University, Zhengzhou 450052, China
  • 收稿日期:2010-08-17 修回日期:2010-09-02 出版日期:2011-02-15 发布日期:2011-02-15
  • 基金资助:
    Project supported by the National Natural Science Foundation of China (Grant No. 60807001), the National Basic Research Program of China (Grant No. 2011CB201605), and the Foundation of Henan Educational Committee (Grant No. 2010A140017).

Effects of the sputtering power on the crystalline structure and optical properties of the silver oxide films deposited using direct-current reactive magnetron sputtering

Gao Xiao-Yong(郜小勇), Zhang Zeng-Yuan(张增院), Ma Jiao-Min(马姣民), Lu Jing-Xiao(卢景霄), Gu Jin-Hua(谷锦华), and Yang Shi-E(杨仕娥)   

  1. The Key Lab of Materials Physics of Ministry of Education, School of Physics and Engineering, Zhengzhou University, Zhengzhou 450052, China
  • Received:2010-08-17 Revised:2010-09-02 Online:2011-02-15 Published:2011-02-15
  • Supported by:
    Project supported by the National Natural Science Foundation of China (Grant No. 60807001), the National Basic Research Program of China (Grant No. 2011CB201605), and the Foundation of Henan Educational Committee (Grant No. 2010A140017).

摘要: This paper reports that a series of silver oxide (AgxO) films are deposited on glass substrates by direct-current reactive magnetron sputtering at a substrate temperature of 250 oC and an oxygen flux ratio of 15:18 by modifying the sputtering power (SP). The AgxO films deposited apparently show a structural evolution from cubic biphased (AgO + Ag2O) to cubic single-phased (Ag2O), and to biphased (Ag2O + AgO) structure. Notably, the cubic single-phased Ag2O film is deposited at the SP = 105 W and an AgO phase with <220> orientation discerned in the AgxO films deposited using the SP > 105 W. The transmissivity and reflectivity of the AgxO films in transparent region decrease with the increase the SP, whereas the absorptivity inversely increases with the increase of the SP. These results may be due to the structural evolution and the increasing film thickness. A redshift of the films' absorption edges determined in terms of Tauc formula clearly occurs from 3.1 eV to 2.73 eV with the increase of the SP.

关键词: AgxO film, direct-current reactive magnetron sputtering, x-ray diffraction, optical properties

Abstract: This paper reports that a series of silver oxide (AgxO) films are deposited on glass substrates by direct-current reactive magnetron sputtering at a substrate temperature of 250 ℃ and an oxygen flux ratio of 15:18 by modifying the sputtering power (SP). The AgxO films deposited apparently show a structural evolution from cubic biphased (AgO + Ag2O) to cubic single-phased (Ag2O), and to biphased (Ag2O + AgO) structure. Notably, the cubic single-phased Ag2O film is deposited at the SP = 105 W and an AgO phase withorientation discerned in the AgxO films deposited using the SP > 105 W. The transmissivity and reflectivity of the AgxO films in transparent region decrease with the increase the SP, whereas the absorptivity inversely increases with the increase of the SP. These results may be due to the structural evolution and the increasing film thickness. A redshift of the films' absorption edges determined in terms of Tauc formula clearly occurs from 3.1 eV to 2.73 eV with the increase of the SP.

Key words: AgxO film, direct-current reactive magnetron sputtering, x-ray diffraction, optical properties

中图分类号:  (Semiconductors)

  • 61.82.Fk
61.05.cp (X-ray diffraction) 74.25.Gz (Optical properties) 81.15.Cd (Deposition by sputtering)