中国物理B ›› 2011, Vol. 20 ›› Issue (10): 107701-107701.doi: 10.1088/1674-1056/20/10/107701
蒋泉1, 张春祖2, 周志东3
Zhou Zhi-Dong(周志东)a)†, Zhang Chun-Zu(张春祖)b), and Jiang Quan(蒋泉)c)
摘要: The effects of internal stresses and depolarization fields on the properties of epitaxial ferroelectric perovskite thin films are discussed by employing the dynamic Ginzburg-Landau equation (DGLE). The numerical solution for BaTiO3 film shows that internal stress and the depolarization field have the most effects on ferroelectric properties such as polarization, Curie temperature and susceptibility. With the increase of the thickness of the film, the polarization of epitaxial ferroelectric thin film is enhanced rapidly under high internal compressively stress. With the thickness exceeding the critical thickness for dislocation formation, the polarization increases slowly and even weakens due to relaxed internal stresses and a weak electrical boundary condition. This indicates that the effects of mechanical and electrical boundary conditions both diminish for ferroelectric thick films. Consequently, our thermodynamic method is a full scale model that can predict the properties of ferroelectric perovskite films in a wide range of film thickness.
中图分类号: (Epitaxial and superlattice films)