中国物理B ›› 2000, Vol. 9 ›› Issue (3): 216-221.doi: 10.1088/1009-1963/9/3/011
汤学峰1, 祁金林1, 王景成2, 尤富强2, 殷俊林2
Wang Jing-cheng (王景成)a, You Fu-qiang (尤富强)a, Yin Jun-lin (殷俊林)a, Tang Xue-feng (汤学峰)b, Qi Jin-lin (祁金林)b
摘要: A number of TiNi samples with different compositions and states were measured by positron annihilation technique. And microdefects and the influence of them on shape memory effect were analyzed, giving some valuable information for the study of technological processes of preparing TiNi functional shape memory devices.
中图分类号: (Deformation and plasticity)