中国物理B ›› 2006, Vol. 15 ›› Issue (7): 1558-1562.doi: 10.1088/1009-1963/15/7/030

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Observation of MWCNTs with low-energy electron point source microscope

于洁, 柏鑫, 张兆祥, 张耿民, 郭等柱, 薛增泉   

  1. Key Laboratory for the Physics and Chemistry of Nanodevices and Department of Electronics, Peking University,Beijing 100871, China
  • 收稿日期:2005-12-18 修回日期:2006-02-24 出版日期:2006-07-20 发布日期:2006-07-20
  • 基金资助:
    Project supported by the National Natural Science Foundation of China (Grant Nos.60231010, 60471008, and 60571003) and the National Center for Nanoscience and Technology of China.

Observation of MWCNTs with low-energy electron point source microscope

Yu Jie (于洁), Bai Xin (柏鑫), Zhang Zhao-Xiang (张兆祥), Zhang Geng-Min (张耿民), Guo Deng-Zhu (郭等柱), Xue Zeng-Quan (薛增泉)   

  1. Key Laboratory for the Physics and Chemistry of Nanodevices and Department of Electronics, Peking University,Beijing 100871, China
  • Received:2005-12-18 Revised:2006-02-24 Online:2006-07-20 Published:2006-07-20
  • Supported by:
    Project supported by the National Natural Science Foundation of China (Grant Nos.60231010, 60471008, and 60571003) and the National Center for Nanoscience and Technology of China.

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摘要： The low-energy electron point source (LEEPS) microscope, which creates enlarged projection images with low-energy field emission electron beams, can be used to observe the projection image of nano-scale samples and to characterize the coherence of the field emission beam. In this paper we report the design and test operation performance of a home-made LEEPS microscope. Multi-walled carbon nanotubes (MWCNTs) synthesized by the CVD method were observed by LEEPS microscope using a conventional tungsten tip, and projection images with the magnification of up to 104 was obtained. The resolution of the acquired images is \sim10 nm. A higher resolution and a larger magnification can be expected when the AC magnetic field inside the equipment is shielded and the vibration of the instrument reduced.

关键词: LEEPS microscope, field emission, carbon nanotube

Abstract: The low-energy electron point source (LEEPS) microscope, which creates enlarged projection images with low-energy field emission electron beams, can be used to observe the projection image of nano-scale samples and to characterize the coherence of the field emission beam. In this paper we report the design and test operation performance of a home-made LEEPS microscope. Multi-walled carbon nanotubes (MWCNTs) synthesized by the CVD method were observed by LEEPS microscope using a conventional tungsten tip, and projection images with the magnification of up to 104 was obtained. The resolution of the acquired images is $\sim$10 nm. A higher resolution and a larger magnification can be expected when the AC magnetic field inside the equipment is shielded and the vibration of the instrument reduced.

Key words: LEEPS microscope, field emission, carbon nanotube

中图分类号:  (Nanotubes)

  • 61.46.Fg
79.70.+q (Field emission, ionization, evaporation, and desorption)