中国物理B ›› 2005, Vol. 14 ›› Issue (3): 610-614.doi: 10.1088/1009-1963/14/3/033
马建华1, 孟祥建2, 孙璟兰3, 林铁4, 石富文5, 褚君浩6
Ma Jian-Hua (马建华)a, Meng Xiang-Jian (孟祥建)ab, Sun Jing-Lan (孙璟兰)a, Lin Tie (林铁)a, Shi Fu-Wen (石富文)a, Chu Jun-Hao (褚君浩)a
摘要: SrTiO3 thin films were deposited on vitreous silica substrates by metalorganic decomposition (MOD). The films are polycrystalline cubic in structure with the lattice constants of a=0.39nm. Their optical constants (refractive index n and extinction coefficient k) were calculated by the envelope method from the transmittance spectra in the wavelength range of 190nm to 1100nm. The refractive index of the present films is found to be higher than that of the other SrTiO3 films prepared by RF sputtering, sol—gel and chemical vapour deposition. The dispersion of the refractive index in the films follows the single electronic oscillator model with oscillator strength (S0) of 0.88×1014m-2 and oscillator energy (E0
中图分类号: (Insulators)