Effects of electrical stress on the characteristics and defect behaviors in GaN-based near-ultraviolet light emitting diodes
Ying-Zhe Wang(王颖哲), Mao-Sen Wang(王茂森), Ning Hua(化宁), Kai Chen(陈凯), Zhi-Min He(何志敏), Xue-Feng Zheng(郑雪峰), Pei-Xian Li(李培咸), Xiao-Hua Ma(马晓华), Li-Xin Guo(郭立新), and Yue Hao(郝跃)
Effects of electrical stress on the characteristics and defect behaviors in GaN-based near-ultraviolet light emitting diodes
Ying-Zhe Wang(王颖哲), Mao-Sen Wang(王茂森), Ning Hua(化宁), Kai Chen(陈凯), Zhi-Min He(何志敏), Xue-Feng Zheng(郑雪峰), Pei-Xian Li(李培咸), Xiao-Hua Ma(马晓华), Li-Xin Guo(郭立新), and Yue Hao(郝跃)
中国物理B
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2022, (6): 68101
-068101
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DOI: 10.1088/1674-1056/ac4cb8