Investigation of single event effect in 28-nm system-on-chip with multi patterns
Wei-Tao Yang(杨卫涛), Yong-Hong Li(李永宏), Ya-Xin Guo(郭亚鑫), Hao-Yu Zhao(赵浩昱), Yang Li(李洋), Pei Li(李培), Chao-Hui He(贺朝会), Gang Guo(郭刚), Jie Liu(刘杰), Sheng-Sheng Yang(杨生胜), Heng An(安恒)
中国物理B
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2020, (10): 108504
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DOI: 10.1088/1674-1056/ab99b8