Negative gate bias stress effects on conduction and low frequency noise characteristics in p-type poly-Si thin-film transistors
韩朝阳, 刘远, 刘玉荣, 陈雅怡, 王黎, 陈荣盛
Negative gate bias stress effects on conduction and low frequency noise characteristics in p-type poly-Si thin-film transistors
Chao-Yang Han(韩朝阳), Yuan Liu(刘远), Yu-Rong Liu(刘玉荣), Ya-Yi Chen(陈雅怡), Li Wang(王黎), Rong-Sheng Chen(陈荣盛)
中国物理B
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2019, (8): 88502
-088502
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DOI: 10.1088/1674-1056/28/8/088502