Optical characterization of defects in narrow-gap HgCdTe for infrared detector applications
越方禹, 马骕驭, 洪进, 杨平雄, 敬承斌, 陈晔, 褚君浩
Optical characterization of defects in narrow-gap HgCdTe for infrared detector applications
Fang-Yu Yue(越方禹), Su-Yu Ma(马骕驭), Jin Hong(洪进), Ping-Xiong Yang(杨平雄), Cheng-Bin Jing(敬承斌), Ye Chen(陈晔), Jun-Hao Chu(褚君浩)
中国物理B
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2019, (1): 17104
-017104
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DOI: 10.1088/1674-1056/28/1/017104