Heavy ion induced upset errors in 90-nm 64 Mb NOR-type floating-gate Flash memory
毕津顺, 习凯, 李博, 王海滨, 季兰龙, 李金, 刘明
Heavy ion induced upset errors in 90-nm 64 Mb NOR-type floating-gate Flash memory
Jin-Shun Bi(毕津顺), Kai Xi(习凯), Bo Li(李博), Hai-Bin Wang(王海滨), Lan-Long Ji(季兰龙), Jin Li(李金), Ming Liu(刘明)
中国物理B
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2018, (9): 98501
-098501
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DOI: 10.1088/1674-1056/27/9/098501