Analysis of multiple cell upset sensitivity in bulk CMOS SRAM after neutron irradiation

潘霄宇, 郭红霞, 罗尹虹, 张凤祁, 丁李利

Xiaoyu Pan(潘霄宇), Hongxia Guo(郭红霞), Yinhong Luo(罗尹虹), Fengqi Zhang(张凤祁), Lili Ding(丁李利)

中国物理B . 2018, (3): 38501 -038501 . DOI: 10.1088/1674-1056/27/3/038501