Thermal stability and data retention of resistive random access memory with HfO
x/ZnO double layers
赖云锋, 陈凡, 曾泽村, 林培杰, 程树英, 俞金玲
Thermal stability and data retention of resistive random access memory with HfO
x/ZnO double layers
Yun-Feng Lai(赖云锋), Fan Chen(陈凡), Ze-Cun Zeng(曾泽村), Pei-Jie Lin(林培杰), Shu-Ying Cheng(程树英), Jin-Ling Yu(俞金玲)
中国物理B
.
2017, (8): 87305
-087305
.
DOI: 10.1088/1674-1056/26/8/087305