Scaling dependence of memory windows and different carrier charging behaviors in Si nanocrystal nonvolatile memory devices
于杰, 陈坤基, 马忠元, 张鑫鑫, 江小帆, 吴仰晴, 黄信凡, Shunri Oda
Scaling dependence of memory windows and different carrier charging behaviors in Si nanocrystal nonvolatile memory devices
Jie Yu(于杰), Kun-ji Chen(陈坤基), Zhong-yuan Ma(马忠元), Xin-xin Zhang(张鑫鑫), Xiao-fan Jiang(江小帆), Yang-qing Wu(吴仰晴), Xin-fan Huang(黄信凡), Shunri Oda
中国物理B
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2016, (9): 97304
-097304
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DOI: 10.1088/1674-1056/25/9/097304