Comparison of radiation degradation induced by x-rayand 3-MeV protons in 65-nm CMOS transistors
丁李利, Simone Gerardin, Marta Bagatin, Dario Bisello, Serena Mattiazzo, Alessandro Paccagnella
Comparison of radiation degradation induced by x-rayand 3-MeV protons in 65-nm CMOS transistors
Lili Ding(丁李利), Simone Gerardin, Marta Bagatin, Dario Bisello, Serena Mattiazzo, Alessandro Paccagnella
中国物理B
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2016, (9): 96110
-096110
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DOI: 10.1088/1674-1056/25/9/096110