Electrical properties and microstructural characterization of Ni/Ta contacts to n-type 6H-SiC
周天宇, 刘学超, 黄维, 卓世异, 郑燕青, 施尔畏
Electrical properties and microstructural characterization of Ni/Ta contacts to n-type 6H-SiC
Zhou Tian-Yu (周天宇), Liu Xue-Chao (刘学超), Huang Wei (黄维), Zhuo Shi-Yi (卓世异), Zheng Yan-Qing (郑燕青), Shi Er-Wei (施尔畏)
中国物理B
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2015, (12): 126801
-126801
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DOI: 10.1088/1674-1056/24/12/126801