Analysis of functional failure mode of commercial deep sub-micron SRAM induced by total dose irradiation
郑齐文, 崔江维, 周航, 余德昭, 余学峰, 陆妩, 郭旗, 任迪远
Analysis of functional failure mode of commercial deep sub-micron SRAM induced by total dose irradiation
Zheng Qi-Wen (郑齐文), Cui Jiang-Wei (崔江维), Zhou Hang (周航), Yu De-Zhao (余德昭), Yu Xue-Feng (余学峰), Lu Wu (陆妩), Guo Qi (郭旗), Ren Di-Yuan (任迪远)
中国物理B
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2015, (10): 106106
-106106
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DOI: 10.1088/1674-1056/24/10/106106