Influence of white light illumination on the performance of a-IGZO thin film transistor under positive gate-bias stress
汤兰凤, 于广, 陆海, 武辰飞, 钱慧敏, 周东, 张荣, 郑有炓, 黄晓明
Influence of white light illumination on the performance of a-IGZO thin film transistor under positive gate-bias stress
Tang Lan-Feng (汤兰凤), Yu Guang (于广), Lu Hai (陆海), Wu Chen-Fei (武辰飞), Qian Hui-Min (钱慧敏), Zhou Dong (周东), Zhang Rong (张荣), Zheng You-Dou (郑有炓), Huang Xiao-Ming (黄晓明)
中国物理B
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2015, (8): 88504
-088504
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DOI: 10.1088/1674-1056/24/8/088504