Charge trapping behavior and its origin in Al
2O
3/SiC MIS system
刘新宇, 王弋宇, 彭朝阳, 李诚瞻, 吴佳, 白云, 汤益丹, 刘可安, 申华军
Charge trapping behavior and its origin in Al
2O
3/SiC MIS system
Liu Xin-Yu (刘新宇), Wang Yi-Yu (王弋宇), Peng Zhao-Yang (彭朝阳), Li Cheng-Zhan (李诚瞻), Wu Jia (吴佳), Bai Yun (白云), Tang Yi-Dan (汤益丹), Liu Ke-An (刘可安), Shen Hua-Jun (申华军)
中国物理B
.
2015, (8): 87304
-087304
.
DOI: 10.1088/1674-1056/24/8/087304