Effect of body biasing on single-event induced charge collection in deep N-well technology
丁一, 胡建国, 秦军瑞, 谭洪舟
Effect of body biasing on single-event induced charge collection in deep N-well technology
Ding Yi (丁一), Hu Jian-Guo (胡建国), Qin Jun-Rui (秦军瑞), Tan Hong-Zhou (谭洪舟)
中国物理B . 2015, (7): 79401 -079401 .  DOI: 10.1088/1674-1056/24/7/079401