Simulation and experimental study of high power microwave damage effect on AlGaAs/InGaAs pseudomorphic high electron mobility transistor
于新海, 柴常春, 刘阳, 杨银堂, 席晓文
Simulation and experimental study of high power microwave damage effect on AlGaAs/InGaAs pseudomorphic high electron mobility transistor
Yu Xin-Hai (于新海), Chai Chang-Chun (柴常春), Liu Yang (刘阳), Yang Yin-Tang (杨银堂), Xi Xiao-Wen (席晓文)
Chin. Phys. B . 2015, (4): 48502 -048502 .  DOI: 10.1088/1674-1056/24/4/048502