Defect reduction in GaAs/Si film with InAs quantum-dot dislocation filter grown by metalorganic chemical vapor deposition
王俊, 胡海洋, 邓灿, 贺云瑞, 王琦, 段晓峰, 黄永清, 任晓敏
Defect reduction in GaAs/Si film with InAs quantum-dot dislocation filter grown by metalorganic chemical vapor deposition
Wang Jun (王俊), Hu Hai-Yang (胡海洋), Deng Can (邓灿), He Yun-Rui (贺云瑞), Wang Qi (王琦), Duan Xiao-Feng (段晓峰), Huang Yong-Qing (黄永清), Ren Xiao-Min (任晓敏)
中国物理B
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2015, (2): 28101
-028101
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DOI: 10.1088/1674-1056/24/2/028101