Impact of substrate injected hot electrons on hot carrier degradation in a 180-nm NMOSFET

梁斌, 陈建军, 池雅庆

Liang Bin (梁斌), Chen Jian-Jun (陈建军), Chi Ya-Qing (池雅庆)

中国物理B . 2014, (11): 117304 -117304 . DOI: 10.1088/1674-1056/23/11/117304