Effects of interface roughness on photoluminescence full width at half maximum in GaN/AlGaN quantum wells
王维颖, 刘贵鹏, 金鹏, 毛德丰, 李维, 王占国, 田武, 陈长清
Effects of interface roughness on photoluminescence full width at half maximum in GaN/AlGaN quantum wells
Wang Wei-Ying (王维颖), Liu Gui-Peng (刘贵鹏), Jin Peng (金鹏), Mao De-Feng (毛德丰), Li Wei (李维), Wang Zhan-Guo (王占国), Tian Wu (田武), Chen Chang-Qing (陈长清)
中国物理B
.
2014, (11): 117803
-117803
.
DOI: 10.1088/1674-1056/23/11/117803