Positive gate-bias temperature instability of ZnO thin-film transistor

刘玉荣, 苏晶, 黎沛涛, 姚若河

Liu Yu-Rong (刘玉荣), Su Jing (苏晶), Lai Pei-Tao (黎沛涛), Yao Ruo-He (姚若河)

中国物理B . 2014, (6): 68501 -068501 . DOI: 10.1088/1674-1056/23/6/068501