Structural and electrical characterization of annealed Si 1-xC x/SiC thin film prepared by magnetron sputtering
黄仕华, 刘剑
Structural and electrical characterization of annealed Si 1-xC x/SiC thin film prepared by magnetron sputtering
Huang Shi-Hua (黄仕华), Liu Jian (刘剑)
中国物理B . 2014, (5): 58105 -058105 .  DOI: 10.1088/1674-1056/23/5/058105