Flat-roof phenomenon of dynamic equilibrium phase in the negative bias temperature instability effect on a power MOSFET

张月, 卓青青, 刘红侠, 马晓华, 郝跃

Zhang Yue (张月), Zhuo Qing-Qing (卓青青), Liu Hong-Xia (刘红侠), Ma Xiao-Hua (马晓华), Hao Yue (郝跃)

中国物理B . 2014, (5): 57304 -057304 . DOI: 10.1088/1674-1056/23/5/057304