Single event effect in a ferroelectric-gate field-effect transistor under heavy-ion irradiation
燕少安, 唐明华, 赵雯, 郭红霞, 张万里, 徐新宇, 王旭东, 丁浩, 陈建伟, 李正, 周益春
Single event effect in a ferroelectric-gate field-effect transistor under heavy-ion irradiation
Yan Shao-An (燕少安), Tang Ming-Hua (唐明华), Zhao Wen (赵雯), Guo Hong-Xia (郭红霞), Zhang Wan-Li (张万里), Xu Xin-Yu (徐新宇), Wang Xu-Dong (王旭东), Ding Hao (丁浩), Chen Jian-Wei (陈建伟), Li Zheng (李正), Zhou Yi-Chun (周益春)
中国物理B
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2014, (4): 46104
-046104
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DOI: 10.1088/1674-1056/23/4/046104