Scaling effects of single-event gate rupture in thin oxides
丁李利, 陈伟, 郭红霞, 闫逸华, 郭晓强, 范如玉
Scaling effects of single-event gate rupture in thin oxides
Ding Li-Li (丁李利), Chen Wei (陈伟), Guo Hong-Xia (郭红霞), Yan Yi-Hua (闫逸华), Guo Xiao-Qiang (郭晓强), Fan Ru-Yu (范如玉)
中国物理B
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2013, (11): 118501
-118501
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DOI: 10.1088/1674-1056/22/11/118501