Angular dependence of multiple-bit upset response in static random access memories under heavy ion irradiation
张战刚, 刘杰, 侯明东, 孙友梅, 苏弘, 段敬来, 莫丹, 姚会军, 罗捷, 古松, 耿超, 习凯
Angular dependence of multiple-bit upset response in static random access memories under heavy ion irradiation
Zhang Zhan-Gang (张战刚), Liu Jie (刘杰), Hou Ming-Dong (侯明东), Sun You-Mei (孙友梅), Su Hong (苏弘), Duan Jing-Lai (段敬来), Mo Dan (莫丹), Yao Hui-Jun (姚会军), Luo Jie (罗捷), Gu Song (古松), Geng Chao (耿超), Xi Kai (习凯)
中国物理B
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2013, (8): 86102
-086102
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DOI: 10.1088/1674-1056/22/8/086102