Monte Carlo evaluation of spatial multiple-bit upset sensitivity to oblique incidence
耿超, 刘杰, 习凯, 张战刚, 古松, 侯明东, 孙友梅, 段敬来, 姚会军, 莫丹
Monte Carlo evaluation of spatial multiple-bit upset sensitivity to oblique incidence
Geng Chao (耿超), Liu Jie (刘杰), Xi Kai (习凯), Zhang Zhan-Gang (张战刚), Gu Song (古松), Hou Ming-Dong (侯明东), Sun You-Mei (孙友梅), Duan Jing-Lai (段敬来), Yao Hui-Jun (姚会军), Mo Dan (莫丹)
中国物理B
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2013, (5): 59501
-059501
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DOI: 10.1088/1674-1056/22/5/059501