Combined frequency- and time-domain photocarrier radiometry characterization of ion-implanted and thermally annealed silicon wafers
任胜东, 李斌成, 高丽峰, 王谦
Combined frequency- and time-domain photocarrier radiometry characterization of ion-implanted and thermally annealed silicon wafers
Ren Sheng-Dong (任胜东), Li Bin-Cheng (李斌成), Gao Li-Feng (高丽峰), Wang Qian (王谦)
中国物理B . 2013, (5): 57202 -057202 .  DOI: 10.1088/1674-1056/22/5/057202