Temperature dependence of single event transient in 90-nm CMOS dual-well and triple-well NMOSFETs
李达维, 秦军瑞, 陈书明
Temperature dependence of single event transient in 90-nm CMOS dual-well and triple-well NMOSFETs
Li Da-Wei (李达维), Qin Jun-Rui (秦军瑞), Chen Shu-Ming (陈书明)
中国物理B . 2013, (2): 29401 -029401 .  DOI: 10.1088/1674-1056/22/2/029401