Pulsed microwave damage trend of bipolar transistor as a function of pulse parameters
马振洋, 柴常春, 任兴荣, 杨银堂, 赵颖博, 乔丽萍
Pulsed microwave damage trend of bipolar transistor as a function of pulse parameters
Ma Zhen-Yang (马振洋), Chai Chang-Chun (柴常春), Ren Xing-Rong (任兴荣), Yang Yin-Tang (杨银堂), Zhao Ying-Bo (赵颖博), Qiao Li-Ping (乔丽萍 )
Chin. Phys. B
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2013, (2): 28502
-028502
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DOI: 10.1088/1674-1056/22/2/028502