Impact of substrate bias on radiation-induced edge effects in MOSFETs
胡志远, 刘张李, 邵华, 张正选, 宁冰旭, 陈明, 毕大炜, 邹世昌
Impact of substrate bias on radiation-induced edge effects in MOSFETs
Hu Zhi-Yuan(胡志远), Liu Zhang-Li(刘张李), Shao-Hua(邵华), Zhang Zheng-Xuan(张正选), Ning Bing-Xu(宁冰旭), Chen Ming(陈明), Bi Da-Wei(毕大炜), and Zou Shi-Chang(邹世昌)
中国物理B
.
2011, (12): 120702
-120702
.
DOI: 10.1088/1674-1056/20/12/120702