A statistical RCL interconnect delay model taking account of process variations
朱樟明, 万达经, 杨银堂, 恩云飞
A statistical RCL interconnect delay model taking account of process variations
Zhu Zhang-Ming(朱樟明), Wan Da-Jing(万达经), Yang Yin-Tang(杨银堂), and En Yun-Fei(恩云飞)
中国物理B . 2011, (1): 18401 -018401 .  DOI: 10.1088/1674-1056/20/1/018401