A new model for electromigration grain boundary noise based on free volume
何亮, 杜磊, 庄奕琪, 陈华, 陈文豪, 李伟华, 孙鹏
A new model for electromigration grain boundary noise based on free volume
He Liang(何亮), Du Lei(杜磊), Zhuang Yi-Qi(庄奕琪), Chen Hua(陈华), Chen Wen-Hao(陈文豪), Li Wei-Hua(李伟华), and Sun Peng(孙鹏)
中国物理B
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2010, (9): 97202
-097202
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DOI: 10.1088/1674-1056/19/9/097202