Capacitance characteristics of metal-oxide-semiconductor capacitors with a single layer of embedded nickel nanoparticles for the application of nonvolatile memory
李卫, 徐岭, 赵伟明, 丁宏林, 马忠元, 徐骏, 陈坤基
Capacitance characteristics of metal-oxide-semiconductor capacitors with a single layer of embedded nickel nanoparticles for the application of nonvolatile memory
Li Wei(李卫), Xu Ling(徐岭), Zhao Wei-Ming(赵伟明), Ding Hong-Lin(丁宏林), Ma Zhong-Yuan(马忠元), Xu Jun(徐骏), and Chen Kun-Ji(陈坤基)
中国物理B
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2010, (4): 47308
-047308
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DOI: 10.1088/1674-1056/19/4/047308