Ohmic contacts of 4H-SiC on ion-implantation layers
王守国, 张岩, 张义门, 张玉明
Ohmic contacts of 4H-SiC on ion-implantation layers
Wang Shou-Guo(王守国), Zhang Yan(张岩), Zhang Yi-Men(张义门), and Zhang Yu-Ming(张玉明)
中国物理B
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2010, (1): 17204
-017204
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DOI: 10.1088/1674-1056/19/1/017204