Four-probe scanning tunnelling microscope with atomic resolution for electrical and electro-optical property measurements of nanosystems
林晓, 贺晓波, 路军岭, 高利, 郇庆, 时东霞, 高鸿钧
Four-probe scanning tunnelling microscope with atomic resolution for electrical and electro-optical property measurements of nanosystems
Lin Xiao (林晓), He Xiao-Bo (贺晓波), Lu Jun-Ling (路军岭), Gao Li (高利), Huan Qing (郇庆), Shi Dong-Xia (时东霞), Gao Hong-Jun (高鸿钧)
中国物理B
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2005, (8): 1536
-1543
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DOI: 10.1088/1009-1963/14/8/011