A novel technique for predicting ionizing radiation effects of commercial MOS devices

张国强, 郭旗, 艾尔肯, 陆妩, 任迪远

Zhang Guo-Qiang (张国强), Guo Qi (郭旗), Erkin (艾尔肯), Lu Wu (陆妩), Ren Di-Yuan (任迪远)

中国物理B . 2004, (6): 948 -953 . DOI: 10.1088/1009-1963/13/6/028