Molecular dynamics simulation for the sputtering of an Al <sub>2</sub>O <sub>3</sub> sample bombarded with MeV Si ions

薛建明, 今西信嗣

Molecular dynamics simulation for the sputtering of an Al ₂O ₃ sample bombarded with MeV Si ions

Xue Jian-Ming (薛建明), Nobutsugu Imanishi (今西信嗣)

中国物理B . 2002, (12): 1267 -1271 . DOI: 10.1088/1009-1963/11/12/309