CHARACTERIZATION OF POLYCRYSTALLINE GRADIENT THIN FILM BY X-RAY DIFFRACTION METHOD
李彬, 陶琨, 刘兴涛, 苗伟, 冯涛, 杨宁, 柳百新
CHARACTERIZATION OF POLYCRYSTALLINE GRADIENT THIN FILM BY X-RAY DIFFRACTION METHOD
Li Bin (李彬), Tao Kun (陶琨), Liu Xing-tao (刘兴涛), Miao Wei (苗伟), Feng Tao (冯涛), Yang Ning (杨宁), Liu Bai-xin (柳百新)
中国物理B
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2000, (4): 284
-289
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DOI: 10.1088/1009-1963/9/4/007