DETERMINATION OF CAPTURE BARRIERS OF DEFECTS FOR GaAs ALLOYS AND TRANSIENT PHOTO-RESISTIVITY SPECTROSCOPY

王海龙, 封松林, 周洁, 杨锡震

WANG HAI-LONG (王海龙), FENG SONG-LIN (封松林), ZHOU JIE (周洁), YANG XI-ZHEN (杨锡震)

中国物理B . 1996, (1): 1 -9 . DOI: 10.1088/1004-423X/5/1/001