ELECTROREFLECTANCE SPECTRA OF Ge
xSi
1-x/Si STRAINED LAYER MULTIPLE-QUANTUM WELLS
潘士宏, 黄硕, 汪忠和, 陈卫, 张存洲, 盛篪, 王迅
ELECTROREFLECTANCE SPECTRA OF Ge
xSi
1-x/Si STRAINED LAYER MULTIPLE-QUANTUM WELLS
PAN SHI-HONG (潘士宏), HUANG SHUO (黄硕), WANG ZHONG-HE (汪忠和), CHEN WEI (陈卫), ZHANG CUN-ZHOU (张存洲), SHENG CHI (盛篪), WANG XUN (王迅)
中国物理B
.
1994, (3): 216
-229
.
DOI: 10.1088/1004-423X/3/3/008