In situ non-destructive measurement of Josephson junction resistance using fritting contact technique

doi:10.1088/1674-1056/ad73b6

中国物理B ›› 2024, Vol. 33 ›› Issue (11): 110309-110309.doi: 10.1088/1674-1056/ad73b6

所属专题： SPECIAL TOPIC — Fabrication and manipulation of the second-generation quantum systems

In situ non-destructive measurement of Josephson junction resistance using fritting contact technique

Lei Du(杜磊)^1,2, Hao-Ran Tao(陶浩然)^1,2, Liang-Liang Guo(郭亮亮)^1,2, Hai-Feng Zhang(张海峰)^1,2, Yong Chen(陈勇)^1,2, Xin Tian(田昕)³, Chi Zhang(张驰)³, Zhi-Long Jia(贾志龙)³, Peng Duan(段鹏)^1,2,†, and Guo-Ping Guo(郭国平)^1,2,3,‡

1 CAS Key Laboratory of Quantum Information, University of Science and Technology of China, Hefei 230026, China;
2 CAS Center for Excellence and Synergetic Innovation Center in Quantum Information and Quantum Physics, University of Science and Technology of China, Hefei 230026, China;
3 Origin Quantum Computing Technology (Hefei) Co., Ltd., Hefei 230088, China

收稿日期:2024-07-22 修回日期:2024-08-26 接受日期:2024-08-27 出版日期:2024-11-15 发布日期:2024-11-15
基金资助:
Project supported by the National Natural Science Foundation of China (Grant Nos. 12034018 and 11625419).

In situ non-destructive measurement of Josephson junction resistance using fritting contact technique

1 CAS Key Laboratory of Quantum Information, University of Science and Technology of China, Hefei 230026, China;
2 CAS Center for Excellence and Synergetic Innovation Center in Quantum Information and Quantum Physics, University of Science and Technology of China, Hefei 230026, China;
3 Origin Quantum Computing Technology (Hefei) Co., Ltd., Hefei 230088, China

Received:2024-07-22 Revised:2024-08-26 Accepted:2024-08-27 Online:2024-11-15 Published:2024-11-15
Contact: Peng Duan, Guo-Ping Guo E-mail:pengduan@ustc.edu.cn;gpguo@ustc.edu.cn
Supported by:
Project supported by the National Natural Science Foundation of China (Grant Nos. 12034018 and 11625419).

摘要/Abstract

摘要： Conventional four-probe methods for measuring the resistance of Josephson junctions can damage superconducting thin films, making them unsuitable for frequency measurements of superconducting qubits. In this study, we present a custom probe station measurement system that employs the fritting contact technique to achieve in situ, non-destructive measurements of Josephson junction resistance. Our experimental results demonstrate that this method allows for accurate prediction of qubit frequency with an error margin of 17.2 MHz. Moreover, the fritting contact technique does not significantly affect qubit coherence time or the integrity of the superconducting film, confirming its non-destructive nature. This innovative approach provides a dependable foundation for frequency tuning and addressing frequency collision issues, thus supporting the advancement and practical deployment of superconducting quantum computing.

关键词: non-destructive, fritting contact, qubit frequency, Josephson junction resistance

Abstract: Conventional four-probe methods for measuring the resistance of Josephson junctions can damage superconducting thin films, making them unsuitable for frequency measurements of superconducting qubits. In this study, we present a custom probe station measurement system that employs the fritting contact technique to achieve in situ, non-destructive measurements of Josephson junction resistance. Our experimental results demonstrate that this method allows for accurate prediction of qubit frequency with an error margin of 17.2 MHz. Moreover, the fritting contact technique does not significantly affect qubit coherence time or the integrity of the superconducting film, confirming its non-destructive nature. This innovative approach provides a dependable foundation for frequency tuning and addressing frequency collision issues, thus supporting the advancement and practical deployment of superconducting quantum computing.

Key words: non-destructive, fritting contact, qubit frequency, Josephson junction resistance

中图分类号: (Quantum computation architectures and implementations)

03.67.Lx

03.67.-a (Quantum information)

Lei Du(杜磊), Hao-Ran Tao(陶浩然), Liang-Liang Guo(郭亮亮), Hai-Feng Zhang(张海峰), Yong Chen(陈勇), Xin Tian(田昕), Chi Zhang(张驰), Zhi-Long Jia(贾志龙), Peng Duan(段鹏), and Guo-Ping Guo(郭国平). In situ non-destructive measurement of Josephson junction resistance using fritting contact technique[J]. 中国物理B, 2024, 33(11): 110309-110309.

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In situ non-destructive measurement of Josephson junction resistance using fritting contact technique

In situ non-destructive measurement of Josephson junction resistance using fritting contact technique

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